• DocumentCode
    1260646
  • Title

    Performance roughness characterization for high density magnetic recording systems

  • Author

    Liu, Bo ; Hu, Sheng-Bin ; Zhou, Gongye ; Zhang, Wei ; Mydeen, Abusalih S M

  • Author_Institution
    Data Storage Inst., Singapore univ., Singapore
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    3983
  • Lastpage
    3985
  • Abstract
    As technology moves to 40 Gb/in2 areal densities and channel density above 3, media homogeneity and nonlinear transition interaction become crucial in defining the reliability of the recording systems. As a result, mapping and zoom-in analysis of the recording capability/performance becomes important. Two concepts are proposed in this work for performance analysis: recording performance roughness analysis and dynamic magnetic roughness analysis. The recording performance roughness analysis is based on an in-situ measurement technique of the nonlinear transition shift (NLTS). Relationship between the performance roughness and the roughness of dynamic magnetic parameters are studied. Results of experimental investigations indicate that the NLTS based performance roughness analysis can reveal more details on media´s recording capability and the capability fluctuation and is an effective method for performance evaluation and failure analysis
  • Keywords
    failure analysis; magnetic disc storage; magnetic heads; magnetic recording noise; performance evaluation; reliability; surface topography; dynamic magnetic roughness analysis; failure analysis; head-disk spacing; high density magnetic recording systems; in-situ measurement; nonlinear transition shift; performance roughness analysis; recording performance roughness; recording system reliability; Disk drives; Disk recording; Failure analysis; Fluctuations; Magnetic analysis; Magnetic recording; Memory; Performance analysis; Rough surfaces; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800729
  • Filename
    800729