DocumentCode :
1260658
Title :
Characterisation of FeBSiC coated MFM tips using Lorentz electron tomography and MFM
Author :
Scott, J. ; McVitie, S. ; Ferrier, R.P. ; Heydon, G.P. ; Rainforth, W.M. ; Gibbs, M.R.J. ; Tucker, J.W. ; Davies, H.A. ; Bishop, J.E.L.
Author_Institution :
Dept. of Phys. & Astron., Glasgow Univ., UK
Volume :
35
Issue :
5
fYear :
1999
fDate :
9/1/1999 12:00:00 AM
Firstpage :
3986
Lastpage :
3988
Abstract :
Magnetic force microscope (MFM) tips coated with an amorphous ferromagnetic alloy have been studied using MFM and Lorentz electron microscopy. Imaging a standard NIST hard disk sample in the MFM reveals that the character of the tips varies dramatically with film thickness. The stray field distributions of the tips were determined using Lorentz electron tomography, and were found to be consistent with the contrast observed by MFM
Keywords :
amorphous magnetic materials; boron alloys; ferromagnetic materials; image reconstruction; iron alloys; magnetic force microscopy; metallic glasses; scanning-transmission electron microscopy; silicon alloys; sputtered coatings; tomography; FeBSiC; Lorentz electron microscopy; Lorentz electron tomography; MFM image contrast; STEM; amorphous ferromagnetic alloy coated; coated MFM tips; differential phase contrast; hard disk sample; stray field distributions; Amorphous magnetic materials; Amorphous materials; Astronomy; Electron microscopy; Magnetic force microscopy; Magnetic forces; Magnetization; NIST; Physics; Tomography;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.800730
Filename :
800730
Link To Document :
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