• DocumentCode
    1260721
  • Title

    The Poly-SiC MSM Photodiode on Ceramic SiC Substrate for Low-Cost Ultraviolet Light Sensing Applications

  • Author

    Juang, Feng-Renn ; Fang, Yean-Kuen ; Chiang, Yen-Ting ; Wei, Tzu-Chieh ; Lin, Bor-Wen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    11
  • Issue
    12
  • fYear
    2011
  • Firstpage
    3446
  • Lastpage
    3450
  • Abstract
    Pseudo 6H poly-SiC (P6H-SiC) films are deposited on the pressureless-sintering ceramic SiC substrate by rapid thermal chemical vapor deposition technology to develop metal-semiconductor-metal (MSM) photodetectors (PD) for low-cost and high-performance ultraviolet (UV) detecting applications. The sensing performances of the Au/P6H-SiC/ceramic-SiC MSM PD were examined by measurement of photo and dark currents with and without the irradiation of 366 and 254 nm UV lights. At room temperature/250°C, the photo/dark current ratio of the P6H-SiC MSM PD is ~ 20.66/8.98, respectively, under irradiation of UV light, which are higher than that of ~ 4.88/0.22 for the polycrystalline β-SiC MSM PD on silicon substrate.
  • Keywords
    chemical vapour deposition; metal-semiconductor-metal structures; optical sensors; photodetectors; photodiodes; polymers; silicon compounds; ultraviolet detectors; wide band gap semiconductors; MSM PD; SiC; UV light irradiation; dark current measurement; high-performance ultraviolet detecting applications; low-cost ultraviolet light sensing applications; metal-semiconductor-metal photodetectors; photo current measurement; pressureless-sintering ceramic substrate; rapid thermal chemical vapor deposition technology; temperature 250 degC; temperature 293 K to 298 K; CMOS integrated circuits; Ceramics; Dark current; Silicon carbide; Substrates; Temperature measurement; Ultraviolet sources; Ceramic SiC; P6H-SiC; metal-semiconductor-metal (MSM); photo/dark current ratio (PDCR); ultraviolet (UV) detector;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2011.2160848
  • Filename
    5934577