DocumentCode :
1260847
Title :
Computationally efficient and numerically stable reliability bounds for repairable fault-tolerant systems
Author :
Carrasco, Juan A.
Author_Institution :
Dept. d´´Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
Volume :
51
Issue :
3
fYear :
2002
fDate :
3/1/2002 12:00:00 AM
Firstpage :
254
Lastpage :
268
Abstract :
The transient analysis of large continuous time Markov reliability models of repairable fault-tolerant systems is computationally expensive due to model stiffness. We develop and analyze a method to compute bounds for a measure defined on a particular, but quite wide class of continuous time Markov models, encompassing both exact and bounding continuous time Markov reliability models of fault-tolerant systems. The method is numerically stable and computes the bounds with well-controlled and specifiable-in-advance error. Computational effort can be traded off with bounds accuracy. For a class of continuous time Markov models, class C", including typical failure/repair reliability models with exponential failure and repair time distributions and repair in every state with failed components, the method can yield reasonably tight bounds at a very small computational cost. The method builds upon a recently proposed numerical method for the transient analysis of continuous time Markov models called regenerative randomization
Keywords :
Markov processes; fault tolerant computing; numerical stability; computational cost; computationally efficient reliability bounds; continuous time Markov models; exact bounding continuous time Markov reliability models; exponential failure; failure/repair reliability models; fault-tolerant systems; large continuous time Markov reliability models; model stiffness; numerical method; numerically stable reliability bounds; regenerative randomization; repair time distributions; repairable fault-tolerant systems; specifiable-in-advance error; transient analysis; Fault tolerance;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.990125
Filename :
990125
Link To Document :
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