Title :
Complexity measures of supervised classification problems
Author :
Ho, Tin Kamo ; Basu, Mitra
Author_Institution :
Lucent Technol. Bell Labs., Murray Hill, NJ, USA
fDate :
3/1/2002 12:00:00 AM
Abstract :
We studied a number of measures that characterize the difficulty of a classification problem, focusing on the geometrical complexity of the class boundary. We compared a set of real-world problems to random labelings of points and found that real problems contain structures in this measurement space that are significantly different from the random sets. Distributions of problems in this space show that there exist at least two independent factors affecting a problem´s difficulty. We suggest using this space to describe a classifier´s domain of competence. This can guide static and dynamic selection of classifiers for specific problems as well as subproblems formed by confinement, projection, and transformations of the feature vectors
Keywords :
computational complexity; geometry; pattern classification; class boundary; competence domain; complexity measures; dynamic classifier selection; feature vector confinement; feature vector projection; feature vector transformations; geometrical complexity; static classifier selection; supervised classification problems; Extraterrestrial measurements; Labeling;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on