• DocumentCode
    1261209
  • Title

    InGaAsP-InP integrated twin-guide laser diode with grooved corner reflector fabricated by reactive ion beam etching

  • Author

    Jeon, Soo-Kun ; Kim, Moon-Jeong ; Cha, Jung-Ho ; Kwon, Young-Se

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
  • Volume
    38
  • Issue
    5
  • fYear
    2002
  • fDate
    2/28/2002 12:00:00 AM
  • Firstpage
    223
  • Lastpage
    225
  • Abstract
    By introducing grooved comer reflectors at the cavity of an integrated twin-guide laser diode (ITG-LD), optical loss can be reduced, and travelling wave characteristics such as mode purity are simultaneously enhanced. The fabricated device shows single-mode operation at current levels up to 1.4 times threshold
  • Keywords
    III-V semiconductors; electric current; gallium arsenide; indium compounds; integrated optoelectronics; plasma materials processing; semiconductor lasers; sputter etching; waveguide lasers; ITG-LD; InGaAsP-InP; InGaAsP-InP integrated twin-guide laser diode; OEIC; current levels; current threshold; grooved comer reflectors; grooved corner reflector; integrated twin-guide laser diode cavity; mode purity; optoelectronic integrated circuit; reactive ion beam etching; single-mode operation; travelling wave characteristic;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20020155
  • Filename
    990208