Inverse Profiling via an Effective Linearized Scattering Model and MRF Regularization

The aim of this letter is to show how a joint adoption of a suitable regularization scheme and a proper rewriting of the traditional electromagnetic scattering equation allows introducing an interesting linear inversion tool which allows achieving nice reconstructions in many cases of practical interest. In particular, an innovative inversion approach which takes definite advantage from the joint use of the Contrast Source-Extended Born model and a Markov-random-field-based regularization scheme is proposed. Numerical examples, confirming accuracy usefulness, are reported and discussed.