Paradigm of sensitivity analysis in EMC stochastic enclosed environments

The aim of this contribution is to present a whole experimental methodology to assess the effects of uncertainties for a classical EMC issue. To this end, a cabinet was designed and achieved with controlled geometrical parameters including moving external slot and internal plate, an inner rotating unit embedded with stirrer and cable. From industrial expectations, the experimental setup and the theoretical basis will be described briefly. Then, the validation (convergence, accuracy and robustness) of the proposed stochastic methods will be obtained facing Monte Carlo (MC) measurements including three random parameters. Finally, the combination of stochastic techniques with sensitivity study will improve the global process.