DocumentCode
1261423
Title
Correlation between head/tape spacing and asperity compliance of magnetic tapes
Author
Tan, Sanwu ; Talke, Frank E.
Author_Institution
Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA
Volume
35
Issue
5
fYear
1999
fDate
9/1/1999 12:00:00 AM
Firstpage
2382
Lastpage
2384
Abstract
Three-wavelength inteferometry is used to measure the head/tape spacing and the contact spacing of metal particle tape as a function of contact pressure. The contact spacing obtained from tape asperity compliance measurements at low contact pressure was found to correlate well with the head/tape spacing, suggesting that asperity compliance measurements can be used to estimate the head/tape spacing under operating conditions
Keywords
light interferometry; magnetic heads; magnetic tape storage; magnetic tapes; asperity compliance; compliance measurements; contact pressure; contact spacing; head/tape spacing; magnetic tapes; metal particle tape; operating conditions; three-wavelength inteferometry; Atomic force microscopy; Atomic measurements; Force measurement; Glass; Interferometry; Magnetic heads; Magnetic recording; Pressure measurement; Rough surfaces; Surface roughness;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.800832
Filename
800832
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