• DocumentCode
    1261503
  • Title

    Diffraction by an arbitrary-angled dielectric wedge. I. Physical optics approximation

  • Author

    Kim, Se-Yun ; Ra, Jung-Woong ; Shin, Sang-Yung

  • Author_Institution
    Appl. Electron. Lab., Korea Inst. of Sci. & Technol., Seoul, South Korea
  • Volume
    39
  • Issue
    9
  • fYear
    1991
  • fDate
    9/1/1991 12:00:00 AM
  • Firstpage
    1272
  • Lastpage
    1281
  • Abstract
    A complete form is presented of the physical optics solution to diffraction by an arbitrary dielectric wedge angle with any relative dielectric constant in cases of both E- and H-polarized plane waves incident on one side of two dielectric interfaces. The solution, which is obtained by performing the physical optics (PO) approximation to the dual integral equation formulated in the spatial frequency domain, is constructed by the geometrical optics terms, including multiple reflection inside the wedge and the edge diffracted field. The diffraction coefficients of the edge diffracted field are represented in a simple form as two finite series of cotangent functions weighted by the Fresnel reflection coefficients. Far-field patterns of the PO solutions for a wedge angle of 45°, relative dielectric constants 2, 10, and 100, and an E-polarized incident angle of 150° are plotted in figures, revealing abrupt discontinuities at dielectric interfaces
  • Keywords
    electromagnetic wave diffraction; physical optics; E-polarised plane waves; Fresnel reflection coefficients; H-polarized plane waves; arbitrary-angled dielectric wedge; dielectric interfaces; dual integral equation; electromagnetic diffraction; far field patterns; geometrical optics; multiple reflection; physical optics; spatial frequency domain; Dielectric constant; Frequency domain analysis; Fresnel reflection; Geometrical optics; Integral equations; Optical diffraction; Optical reflection; Optical refraction; Optical scattering; Physical optics;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.99035
  • Filename
    99035