• DocumentCode
    1261603
  • Title

    Transition From Short-to-Long Cavity and From Self-Mixing to Chaos in a Delayed Optical Feedback Laser

  • Author

    Donati, Silvano ; Fathi, Mohammad Taghi

  • Author_Institution
    Department of Electronics, University of Pavia, Pavia, Italy
  • Volume
    48
  • Issue
    10
  • fYear
    2012
  • Firstpage
    1352
  • Lastpage
    1359
  • Abstract
    We analyze the regime of strong perturbation in a laser diode subjected to delayed optical feedback (DOF) from an external reflector, and study the intermediate region between short and long cavities, using Lang and Kobayashi equations to follow the dynamic regimes of the DOF system. We find that well-known regimes of unperturbed oscillations, period one, multi-periodic, and chaos are dictated by interplay of coupling factor K, distance L, and phase \\Phi ({\\rm mod}.2\\pi) of the external reflector, and linewidth enhancement factor \\alpha . We plot the boundaries of different regimes in the {\\rm K}\\hbox {-}\\Phi plane for several values of L and \\alpha , and characterize them in the transition from very short cavity ({\\rm L}< 0.01~{\\rm L}_{{\\rm fr}}) with negligible high-level effects, to long cavity ({\\rm L}=0.5~{\\rm L}_{{\\rm fr}}) where the {\\rm K}\\hbox {-}\\Phi plane is almost completely filled with chaos. We show that chaos and periodicity regimes are only found at {\\rm C}>1 , though for {\\rm C}< 1 the DOF system is also subject to self-mixing perturbations. Self-mixing induced FM and AM of the optical signal are found in all regions of stable oscillations, and for {\\rm C}>1 frequency switching occurs at a certain \\Phi for any K and L. Chaos develops at increased K and L in correspondence to loci of frequency switching.
  • Keywords
    Cavity resonators; Chaos; Couplings; Frequency modulation; Optical feedback; Optical reflection; Oscillators; Chaos; laser theory; semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2012.2211862
  • Filename
    6264077