DocumentCode :
1261623
Title :
150-GHz Cutoff Frequencies and 2-W/mm Output Power at 40 GHz in a Millimeter-Wave AlGaN/GaN HEMT Technology on Silicon
Author :
Marti, Diego ; Tirelli, Stefano ; Alt, Andreas R. ; Roberts, John ; Bolognesi, C.R.
Author_Institution :
Millimeter-Wave Electron. Group, ETH-Zurich, Zurich, Switzerland
Volume :
33
Issue :
10
fYear :
2012
Firstpage :
1372
Lastpage :
1374
Abstract :
We report a new generation of high-performance AlGaN/GaN high-electron-mobility transistors (HEMTs) grown on high-resistivity Si (111) substrates. We map out small- and large-signal device performances against technological parameters such as the gate length and the source-drain contact separation. We report the first large-signal performance for a GaN-on-Si technology offering an output power of 2 W/mm and an associated peak power-added efficiency of 13.8% (peak of 18.5%) at 40 GHz without any field plate. The technology offers measured transconductances of up to 540 mS/mm and cutoff frequencies as high as fT/fMAX = 152/149 GHz at a given bias point. These are the highest cutoff frequencies to date for fully passivated AlGaN/GaN HEMTs on silicon substrates. The results confirm GaN-on-Si technology as a promising contender for low-cost millimeter-wave power electronic applications.
Keywords :
III-V semiconductors; aluminium compounds; elemental semiconductors; gallium compounds; high electron mobility transistors; millimetre wave field effect transistors; silicon; wide band gap semiconductors; AlGaN-GaN; Si; cutoff frequency; efficiency 13.8 percent; frequency 149 GHz; frequency 150 GHz; frequency 152 GHz; frequency 40 GHz; fully passivated HEMT; gate length; high-electron-mobility transistors; low-cost millimeter-wave power electronic; millimeter-wave HEMT technology; power-added efhciency; silicon substrates; source-drain contact separation; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; Performance evaluation; Power generation; Silicon; AlGaN/GaN on Si; high-electron-mobility transistors (HEMTs); large signal; load-pull characterization;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2012.2204855
Filename :
6264085
Link To Document :
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