DocumentCode
1261667
Title
Panel Summaries - ITC 2001 panels: part 2
Author
Stolicny, Carol
Author_Institution
Intel
Volume
19
Issue
2
fYear
2002
Firstpage
74
Lastpage
76
Keywords
AC generators; Automatic test pattern generation; Automatic testing; Built-in self-test; Design for testability; Economic forecasting; Environmental economics; Manufacturing; Microprocessors; Process design;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2002.990446
Filename
990446
Link To Document