A near-field to far-field transformation method research based on interference source reconstruction

This paper focused on the transformation problem from near-field to far-field data of integrated circuit (IC). The near-field data was obtained by near-field measurement, while the far-field data was what we needed. The key point was learning the nature of interference sources. A method was proposed to compute equivalent sources. Firstly, the value of EM field in the measurement plane was achieved and the parameters of the equivalent source were extracted by adopting least-squares method. Then an equivalent combined source model was put forward to create the far field data. Finally, an example was made to verify the correctness of this method.