Characterization of high density spin valve recording heads by novel magnetic force microscope

Author

Qian, C.X. ; Tong, H.C. ; Liu, F.H. ; Shi, X. ; Dey, S. ; Proksch, R.B. ; Nielson, P. ; Hachfeld, E.

Author_Institution

Read-Rite Corp., Fremont, CA, USA

Volume

35

Issue

5

fYear

1999

fDate

9/1/1999 12:00:00 AM

Firstpage

2625

Lastpage

2627

Abstract

High area density magnetic recording heads with giant-magnetoresistance (GMR) read sensors and focus-ion-beam (FIB) trimmed inductive writers were studied with a special magnetic force microscope (MFM). The MFM was equipped with a magnetoresistance sensitivity mapping (MSM) component that directly measures the magnetoresistance of the reader sensor as a function of position, and a High Frequency MFM (HFMFM) capability that maps 3D high frequency writing field distribution. Good agreement between the MSM measurement and the spin stand tests were obtained. MFM measurement offers unique high spatial resolutions not readily achievable with any other measurement techniques. It is the ideal tool for current and future high area density heads

Keywords

focused ion beam technology; giant magnetoresistance; magnetic force microscopy; magnetic heads; spin valves; area density; focus ion beam trimmed inductive writer; giant magnetoresistance read sensor; high frequency MFM; magnetic force microscopy; magnetic recording; magnetoresistance sensitivity mapping; spatial resolution; spin valve head; Frequency; Giant magnetoresistance; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic recording; Magnetic sensors; Sensor phenomena and characterization; Spin valves;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.800917

Filename

800917