Title :
A narrower side erase band for use with helical scan tape systems
Author :
Nagai, Nobuyuki ; Shirai, Toshio ; Fukuda, Shinich ; Ozue, Tadashi ; Onodera, Seiichi
Author_Institution :
CT Dev. Center, Sony Corp., Yokohama, Japan
fDate :
9/1/1999 12:00:00 AM
Abstract :
The MFM technique is very useful to measure the side erase band. MFM images were processed by FFT to measure the side erase band width and effective track width. Compared with the electromagnetic properties produced using the MR head, the measuring point is defined on FFT processed data. Mrt of the tapes (thickness of magnetic layer), type of recording head and recording frequencies were varied for the sample tapes. The track width of low Mrt tapes showed good stability in different combinations of recording frequency. The side erase band width was reduced when a trimmed MIG head was used. The influence of the recording current for the side erase band was negligible
Keywords :
fast Fourier transforms; magnetic force microscopy; magnetic tapes; FFT; MIG head; MR head; electromagnetic properties; helical scan tape system; image processing; magnetic force microscopy; magnetic layer thickness; recording density; remanence magnetization; side erase band; track width measurement; Computed tomography; Disk recording; Electromagnetic measurements; Frequency; Hard disks; Magnetic force microscopy; Magnetic heads; Magnetic recording; Research and development; Stability;
Journal_Title :
Magnetics, IEEE Transactions on
