• DocumentCode
    1262169
  • Title

    Thermal fluctuation of magnetization in nanocrystalline FePt thin films with high coercivity

  • Author

    Shimatsu, T. ; Lodder, J.C. ; Sugita, Y. ; Nakamura, Y.

  • Author_Institution
    Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    2697
  • Lastpage
    2699
  • Abstract
    The effect of thermal fluctuations of magnetization on static and dynamic properties is discussed for nanocrystalline FePt films. The large magnetocrystalline anisotropy Ku of L10 type FePt results in large KuV/(kT) values of more than 70 even for very fine grain sizes of 7-8 nm, indicating the potential of this alloy film to resist thermal fluctuation of magnetization. It is successfully demonstrated that larger KuV/(kT) values of these films lead to lower magnetic viscosity. Annealing at higher temperature results in larger KuV/kT values and smaller Vact. The remanent coercivity measured at high sweep rate by using pulsed magnetic fields indicates the high thermal stability of these alloy films at high frequencies. However, the results indicated that care should be taken to induce an adequate magnitude of Ku for the FePt alloy to be used as ultrahigh density recording media
  • Keywords
    coercive force; ferromagnetic materials; grain size; iron alloys; magnetic anisotropy; magnetic recording; magnetic thin film devices; magnetic thin films; platinum alloys; thermal stability; FePt; anisotropy; grain sizes; magnetic viscosity; magnetization; nanocrystalline thin films; pulsed magnetic fields; remanent coercivity; sweep rate; thermal fluctuation; thermal stability; ultrahigh density recording media; Anisotropic magnetoresistance; Fluctuations; Grain size; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetic properties; Magnetization; Perpendicular magnetic anisotropy; Pulse measurements;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800956
  • Filename
    800956