Title :
An accelerated test for cobalt migration in thin-film rigid disks
Author :
Lin, Moon-Sun ; Tsai, Changdar ; Sun, YaChun ; Huang, Ward ; Wang, C.M. ; Dong, Charles
Author_Institution :
Trace Storage Technol. Co., Hsinchu, Taiwan
fDate :
9/1/1999 12:00:00 AM
Abstract :
An accelerated direct extraction test was developed to evaluate the cobalt migration in thin film rigid disk. The results obtained using this test show good correlation to the results from the conventional chamber exposure test at 60°C, 70°C, and 80°C with 80% RH for 96 hours
Keywords :
cobalt; hard discs; life testing; magnetic thin film devices; 60 to 80 C; Co; accelerated direct extraction test; chamber exposure test; cobalt migration; thin film rigid disk; Atomic force microscopy; Cobalt; Corrosion; Life estimation; Magnetic heads; Plasma temperature; Scanning electron microscopy; Surface morphology; Testing; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
