• DocumentCode
    1262453
  • Title

    A Practical Probabilistic Method to Evaluate Tolerable Step and Touch Voltages

  • Author

    Wang, Wen ; Velazquez, Raul ; Mukhedkar, Dinkar ; Gervais, Yvon

  • Author_Institution
    Jilin Power Design Institute, Peoples Republic of China
  • Issue
    12
  • fYear
    1984
  • Firstpage
    36
  • Lastpage
    36
  • Keywords
    Contact resistance; Distribution functions; Electric shock; Grounding; Immune system; Probability; Random variables; Sensitivity analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Engineering Review, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1724
  • Type

    jour

  • DOI
    10.1109/MPER.1984.5526222
  • Filename
    5526222