This paper describes the results of torque analysis on the Co-Cr 17-18 at.% sputtered films prepared with the controlled Ar gas pressure (P
Ar) at 4-70 mTorr. At lower P
Ar (P
Ar<20 mTorr), the Co-Cr films show a higher coercive force (H
r) but a smaller magnetic anisotropy constant (K
a). The smaller K
a is considered to be due to the film shape anisotropy induced by surface magnetic charges on the film. The higher H
c is caused by the decrease of the exchange interaction between columnar Co grains with enhanced Cr segregation at grain boundaries. Meanwhile at higher P
Ar(20 mTorr<P
Ar<70 mTorr), the Co-Cr films show a lower H
c but a larger K
a. The lower H
c is caused by the granulation of Co sputtered particles. The rotational hysteresis integral R
h increases gradually from 0.4 to 1.0 with increasing Ar pressure until P
Ar=20 mTorr. The R
h (=0.4) of Co-Cr films at P
Ar=6 mTorr suggests that the coherent rotation of magnetization occurs in the columnar Co grains. On the other hand the R
h remains between 0.7 and 1.0 for Co-Cr films at P
Ar>20 mTorr which indicates the occurrence of incoherent magnetization rotation
