Ferromagnetic resonance in CoZr/Ag/CoZr trilayer films

Author

Baek, J.S. ; Park, Y.J. ; Kim, Y.Y. ; Lim, W.Y. ; Kim, C.O. ; Lee, S.H.

Author_Institution

Dept. of Phys., Korea Univ., Chochiwon, South Korea

Volume

35

Issue

5

fYear

1999

fDate

9/1/1999 12:00:00 AM

Firstpage

3076

Lastpage

3078

Abstract

A series of CoZr(200 Å)/Ag(t_Ag)/CoZr(200 Å) trilayers with Ag interlayer thickness t_Ag in the range of 10-160 Å was deposited on Si(100) wafers at room temperature by using a magnetron sputtering system. In order to understand the dependence of the magnetic exchange interaction between ferromagnetic Co ₈₄Zr₁₆(at.%) layers separated by nonmagnetic Ag layers on the t_Ag, we investigated the FMR spectra. The coupling strength increases with increasing t_Ag up to 20 Å with a maximum value of 2.0 kOe, but decreases rapidly with increasing t_Ag in the range of 40-100 Å. Finally, the value approaches zero above 120 Å. The coupling strength is positive for all samples

Keywords

cobalt alloys; exchange interactions (electron); ferromagnetic materials; ferromagnetic resonance; magnetic multilayers; metallic thin films; silver; sputtered coatings; zirconium alloys; 10 to 160 A; Ag interlayer thickness dependence; CoZr-Ag-CoZr; CoZr/Ag/CoZr trilayer films; FMR spectra; Si; Si(100) wafers; coupling strength; ferromagnetic Co₈₄Zr₁₆ layers; ferromagnetic resonance; magnetic exchange interaction; magnetron sputtered films; nonmagnetic Ag layers; Couplings; Elementary particle exchange interactions; Magnetic field measurement; Magnetic materials; Magnetic multilayers; Magnetic resonance; Magnetic separation; Physics; Sputtering; Temperature distribution;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.801090

Filename

801090