DocumentCode :
1263170
Title :
On the mode II popcorn effect in thin packages
Author :
Alpern, Peter ; Dudek, Rainer ; Schmidt, Roland ; Wicher, Viktor ; Tilgner, Rainer
Author_Institution :
Infineon Technologies AG, Munich, Germany
Volume :
25
Issue :
1
fYear :
2002
fDate :
3/1/2002 12:00:00 AM
Firstpage :
56
Lastpage :
65
Abstract :
Experiments were carried out using P-TQFP-176 packages to study the mode II popcorn effect in thin packages. The doming of the package backside was measured as a function of time and temperature. The measurements were performed using a line projection method. An "accelerated" increase in the doming was found to correlate with the onset of the package crack propagation. It was shown that when a constant critical doming angle is reached, package cracks begin to propagate toward the surface. This critical doming angle was found to be temperature independent between 170°C and 215°C. Furthermore the development of the package doming with time was described by a simple model based on the moisture diffusion from molding compound and die-attach material in combination with a bimaterial plate theory. The water content of the die-attach layer after preconditioning was calculated from the model and it was found to be in good agreement with the results of a three dimensional finite element simulation
Keywords :
cracks; finite element analysis; integrated circuit packaging; moisture; moulding; plastic packaging; 170 to 215 degC; P-TQFP-176 packages; bimaterial plate theory; die-attach material; doming; line projection method; mode II popcorn effect; moisture diffusion; molding compound; package backside; package crack propagation; thin packages; three dimensional finite element simulation; water content; Delamination; Finite element methods; Moisture; Performance evaluation; Plastic integrated circuit packaging; Semiconductor device modeling; Surface cracks; Temperature measurement; Thermal stresses; Time measurement;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/6144.991176
Filename :
991176
Link To Document :
بازگشت