DocumentCode
1263196
Title
Electromagnetic fields with arbitrary wave impedances generated inside a TEM cell
Author
Ma, M.T. ; Larsen, E.B. ; Crawford, M.L.
Author_Institution
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume
33
Issue
4
fYear
1991
fDate
11/1/1991 12:00:00 AM
Firstpage
358
Lastpage
362
Abstract
It is shown that arbitrary electromagnetic fields and wave impedances can be generated inside a transverse electromagnetic (TEM) cell for RF susceptibility testing. This is achieved by simply exciting one port and terminating the other port with appropriate loads. Thus, TEM cells are not limited to producing a planar field environment with the free-space impedance of 377 Ω, but can also be used to generate high-impedance or low-impedance fields for special testing needs. Experimental results for only three load impedances are described. In principle, many other loads including reactive terminations could be used to create a particularly desired field and wave impedance inside the TEM cell
Keywords
electromagnetic compatibility; electromagnetic fields; EMC; RF susceptibility testing; TEM cells; arbitrary electromagnetic fields; arbitrary wave impedances; electromagnetic compatibility; high-impedance fields; load impedances; low-impedance fields; reactive terminations; transverse EM cell; Electromagnetic compatibility; Electromagnetic fields; Frequency; Impedance measurement; Interference; Magnetic field measurement; Performance evaluation; Q measurement; TEM cells; Testing;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/15.99118
Filename
99118
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