DocumentCode :
1263256
Title :
Development of environmentally friendly nonanhydride no-flow underfills
Author :
Zhang, Zhuqing ; Fan, Lianhua ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
25
Issue :
1
fYear :
2002
fDate :
3/1/2002 12:00:00 AM
Firstpage :
140
Lastpage :
147
Abstract :
Most no-flow underfill materials are based on epoxy/anhydride chemistry. Due to the sensitizing nature, the use of anhydride is limited and there is a need for a no-flow underfill using nonanhydride curing system. This paper presents the development of novel no-flow underfill materials-based on epoxy/phenolic resin system. Epoxy and phenolic resins of different structures are evaluated in terms of their curing behavior, thermo-mechanical properties, viscosity, adhesion toward passivation, moisture absorption and the reliability in flip-chip underfill package. The influence of chemical structure and the crosslinking density of the resin on the material properties is investigated. The assembly with nonanhydride underfill shows high reliability from the thermal shock test. Solder wetting test has confirmed the sufficient fluxing capability of phenolic resins. Results show that epoxy/phenolic system has great potential for an environmentally friendly and highly reliable no-flow underfill
Keywords :
adhesion; encapsulation; flip-chip devices; integrated circuit reliability; passivation; polymers; thermal shock; viscosity; adhesion; crosslinking density; curing behavior; epoxy/phenolic resin system; flip-chip package; fluxing capability; moisture absorption; nonanhydride curing system; nonanhydride no-flow underfills; passivation; reliability; solder wetting test; thermal shock test; thermo-mechanical properties; viscosity; Absorption; Adhesives; Chemistry; Curing; Moisture; Passivation; Resins; Testing; Thermomechanical processes; Viscosity;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/6144.991186
Filename :
991186
Link To Document :
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