Title :
Measurement of water absorption in ball grid array package
Author :
Oota, Ken ; Iida, Hiroshi ; Saka, Masumi
Author_Institution :
Electron. Device Mater. Res. Lab., Sumitomo Bakelite Company, Ltd., Tochigi, Japan
fDate :
3/1/2002 12:00:00 AM
Abstract :
The plastic ball grid array (BGA) package has poor resistance to popcorn cracking, which occurs when high temperatures involved in soldering cause water vapor to expand rapidly. Popcorn cracking occurs at die attach paste, and therefore water absorption and desorption occurring in the vicinity of die attach paste must be studied. We examine the mechanism of popcorn cracking in a BGA, particularly from the aspect of water absorption distribution. Water absorption was simulated by use of deuterium oxide, because the absorption performance of deuterium oxide approximates that of water. Deuterium oxide absorption distribution was measured by time of flight secondary ion mass spectroscopy (ToF-SIMS). We found that the water is absorbed mainly through the upper side of molded portion of the BGA package, and that absorption through the substrate is small. A BGA substrate has a laminated structure, and therefore water cannot penetrate the substrate first. On the basis of the results obtained in our study, we designed a BGA package system that is not prone to popcorn cracking
Keywords :
ball grid arrays; integrated circuit measurement; integrated circuit packaging; moisture measurement; plastic packaging; secondary ion mass spectroscopy; soldering; time of flight mass spectroscopy; ToF-SIMS; ball grid array package; die attach paste; laminated structure; molded portion; plastic package; popcorn cracking; soldering; time of flight secondary ion mass spectroscopy; water absorption; Absorption; Deuterium; Electrical resistance measurement; Electronics packaging; Mass spectroscopy; Microassembly; Plastic packaging; Soldering; Temperature; Time measurement;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/6144.991189