• DocumentCode
    1263753
  • Title

    Optomechanical model of surface micromachined tunable optoelectronic devices

  • Author

    Lin, Chien-chung ; Martin, Wayne A. ; Harris, James S., Jr.

  • Author_Institution
    Solid State & Photonics Lab., Stanford Univ., CA, USA
  • Volume
    8
  • Issue
    1
  • fYear
    2002
  • Firstpage
    80
  • Lastpage
    87
  • Abstract
    Linewidth is a critical performance parameter for many optoelectronic devices. We have developed a combined optical and mechanical simulation tool and demonstrate its application to micromachined vertical-cavity tunable optoelectronic devices. The deformation of the mirror surface is calculated from the area moment method. The optical field distribution is calculated by the Fox-Li method, and the diffraction losses are estimated from second-order perturbation theory. By comparison to experimental results, we find that the deformation of the central plate is well predicted by our theory. While deformation can be a major source of linewidth broadening in MEMS tunable optoelectronic devices, it is not the primary source in our devices
  • Keywords
    integrated optoelectronics; light diffraction; micro-optics; micromachining; mirrors; optical design techniques; optical losses; optical tuning; perturbation theory; semiconductor device models; spectral line broadening; Fox-Li method; MEMS tunable optoelectronic devices; area moment method; central plate; deformation; diffraction losses; linewidth broadening; mechanical simulation tool; micromachined vertical-cavity tunable optoelectronic devices; mirror surface; optical field distribution; optoelectronic devices; optomechanical model; performance parameter; second-order perturbation theory; surface micromachined tunable optoelectronic devices; Biomembranes; Mirrors; Optical diffraction; Optical filters; Optical losses; Optical modulation; Optical resonators; Optical surface waves; Optoelectronic devices; Tunable circuits and devices;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/2944.991402
  • Filename
    991402