Title :
In-sawing-lane multi-level BIST for known good dies of LCD drivers
Author :
Wang, Chua-Chin ; Wu, Chi-Feng ; Chen, Sheng-Hua ; Kao, Chia-Hsiung
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
fDate :
9/2/1999 12:00:00 AM
Abstract :
Liquid crystal display (LCD) drivers usually operate at low speed, and have a low input-count but high output-count with multilevel voltages. A novel built-in-self-test (BIST) method for LCD drivers is proposed to reduce testing costs. This BIST circuit will be placed in the sawing lanes to reduce the chip area. The chip overhead and the testing costs are reduced, while the test coverage can be maintained
Keywords :
built-in self test; driver circuits; integrated circuit layout; integrated circuit testing; liquid crystal displays; KGD; LCD drivers; built-in-self-test method; in-sawing-lane BIST; known good dies; liquid crystal display drivers; multilevel BIST; multilevel voltages;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19991057
