Title :
Near infrared wavemeter in polycrystalline germanium on silicon
Author :
Masini, G. ; Colace, L. ; Assanto, G.
Author_Institution :
Dept. of Electron. Eng., Terza Univ., Rome, Italy
fDate :
9/2/1999 12:00:00 AM
Abstract :
A novel solid-state device for the spectral analysis of near infrared light is presented. The device is an array of six photodetectors in polycrystalline Ge on Si, each element being wavelength selective. The fabrication, characterisation and demonstration of the device both as a wavelength meter and spectrum analyser are presented
Keywords :
elemental semiconductors; germanium; infrared detectors; photodetectors; silicon; spectral analysers; wavemeters; Ge-Si; Si; characterisation; fabrication; near IR wavemeter; near infrared wavemeter; photodetector array; polycrystalline Ge on Si; solid-state device; spectral analysis; spectrum analyser; wavelength selective elements;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19991011
