Time- and frequency-domain transient signal analysis for defect detection in CMOS digital ICs

Author

Plusquellic, James F. ; Chiarulli, Donald M. ; Levitan, Steven P.

Author_Institution

Dept. of Comput. Sci. & Electr. Eng., Maryland Univ., Baltimore, MD, USA

Volume

46

Issue

11

fYear

1999

fDate

11/1/1999 12:00:00 AM

Firstpage

1390

Lastpage

1394

Abstract

A novel approach to testing CMOS digital circuits is presented that is based on an analysis of voltage transients at multiple test points and I_DD switching transients on the supply rails. We present results from hardware experiments that show distinguishable characteristics in the transient waveforms of defective and nondefective devices. These variations are shown to exist in both the time domain and frequency domain for CMOS open-drain and bridging defects, located both on and off sensitized paths

Keywords

CMOS digital integrated circuits; frequency-domain analysis; integrated circuit testing; logic testing; switching transients; time-domain analysis; transient analysis; transient response; CMOS digital IC; CMOS digital circuit testing; I_DD switching transients; bridging defects; defect detection; frequency-domain signal analysis; multiple test points; open-drain defects; supply rails; time-domain signal analysis; transient signal analysis; transient waveform characteristics; voltage transients; CMOS digital integrated circuits; Circuit testing; Digital circuits; Frequency domain analysis; Hardware; Rails; Signal analysis; Switching circuits; Transient analysis; Voltage;

fLanguage

English

Journal_Title

Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on

Publisher

ieee

ISSN

1057-7122

Type

jour

DOI

10.1109/81.802843

Filename

802843