DocumentCode :
1265102
Title :
Modeling the Interactions Among Neighboring Nanostructures for Local Feature Characterization and Defect Detection
Author :
Xu, Lijuan ; Huang, Qiang
Author_Institution :
Daniel J. Epstein Dept. of Ind. & Syst. Eng., Univ. of Southern California, Los Angeles, CA, USA
Volume :
9
Issue :
4
fYear :
2012
Firstpage :
745
Lastpage :
754
Abstract :
Since properties of nanomaterials are determined by their structures, characterizing nanostructure feature variability and diagnosing structure defects are of great importance for quality control in scale-up nanomanufacturing. It is known that nanostructure interactions such as competing for source materials during growth contribute strongly to nanostructure uniformity and defect formation. However, there is a lack of rigorous formulation to describe nanostructure interactions and their effects on nanostructure variability. In this work, we develop a method to relate local nanostructure variability (quality measure) to nanostructure interactions under the framework of Gaussian Markov random field. With the developed modeling and estimation approaches, we are able to extract nanostructure interactions for any local region with or without defects based on its feature measurement. The established connection between nanostructure variability and interactions not only provides a metric for assessing nanostructure quality, but also enables a method to automatically detect defects and identify their patterns based on the underlying interaction patterns. Both simulation and real case studies are conducted to demonstrate the developed methods. The insights obtained from real case study agree with physical understanding.
Keywords :
Gaussian processes; II-VI semiconductors; Markov processes; nanofabrication; nanopatterning; nanowires; semiconductor growth; wide band gap semiconductors; zinc compounds; Gaussian Markov random field; ZnO; automatic defect detection; defect formation; nanomaterials properties; nanostructure interaction; nanostructure interaction patterns; nanostructure uniformity; nanostructure variability; quality control; quality measure; scale-up nanomanufacturing; source materials; structural defect; structural properties; zinc oxide nanowires; Feature extraction; Gaussian processes; Markov random fields; Maximum likelihood estimation; Nanowires; Scanning electron microscopy; Defect detection; Gaussian Markov random field; local feature variability; nanostructure interaction;
fLanguage :
English
Journal_Title :
Automation Science and Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
1545-5955
Type :
jour
DOI :
10.1109/TASE.2012.2209417
Filename :
6269088
Link To Document :
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