• DocumentCode
    1265530
  • Title

    Designing a Process Variability Robust Energy-Efficient Control for Complex SoCs

  • Author

    Zakaria, Hatem ; Fesquet, Laurent

  • Author_Institution
    TIMA Lab., Grenoble Univ., Grenoble, France
  • Volume
    1
  • Issue
    2
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    160
  • Lastpage
    172
  • Abstract
    The design of complex systems-on-chip (SoCs) in the upcoming complementary metal-oxide-semiconductor (CMOS) technologies has become increasingly challenging due to the high levels of integration, the excessive energy consumption, the clock distribution problems and the increased process variability impact. To deal with these issues, we consider network-on-chip (NoC) architectures partitioned into several voltage-frequency domains and propose an efficient control algorithm for on-the-fly workload monitoring and management. This algorithm is able to cope with the technology-related variability and with the variable workload of the system. It dynamically controls the speed of the different voltage-frequency islands with respect to the process variability impact on each island. Within this work, a new clock synchronization scheme is also presented. Simulation results demonstrate the effectiveness of our approach in guarantying the average speed performance of the system under different cases of the process variability effect while keeping reduced the overall system energy consumption. Moreover, this is achieved with a small area overhead. The results are validated on a MIPS R2000 processor node using the 45 nm CMOS technology from STMicroelectronics.
  • Keywords
    CMOS integrated circuits; microprocessor chips; network-on-chip; power control; synchronisation; CMOS technology; MIPS R2000 processor; NoC; STMicroelectronics; clock distribution; clock synchronization scheme; complementary metal-oxide-semiconductor technologies; complex SoC; efficient control algorithm; energy consumption; network-on-chip; on-the-fly workload monitoring; process variability robust energy-efficient control; size 45 nm; systems-on-chip; voltage-frequency domains; CMOS integrated circuits; Clocks; Frequency control; Oscillators; Process control; System-on-a-chip; Voltage control; Complementary metal–oxide–semiconductor (CMOS) process variability; energy management; networks-on-chip (NoCs); yield enhancement;
  • fLanguage
    English
  • Journal_Title
    Emerging and Selected Topics in Circuits and Systems, IEEE Journal on
  • Publisher
    ieee
  • ISSN
    2156-3357
  • Type

    jour

  • DOI
    10.1109/JETCAS.2011.2159284
  • Filename
    5941012