DocumentCode
1265675
Title
Automatic test equipment
Author
Vernon, N.
Volume
23
Issue
1
fYear
1977
fDate
1/1/1977 12:00:00 AM
Firstpage
44
Lastpage
48
Abstract
As electronic circuits and systems have increased in complexity in recent years, so has the need to develop more sophisticated and easy-to-use automatic test equipment. The first generation of a.t.e, designed to stimulate circuit elements and examine outputs, has given way to guided-probe systems, which are resembling more and more closely the behaviour of skilled test technicians
fLanguage
English
Journal_Title
Electronics and Power
Publisher
iet
ISSN
0013-5127
Type
jour
DOI
10.1049/ep.1977.0025
Filename
5184089
Link To Document