• DocumentCode
    1265675
  • Title

    Automatic test equipment

  • Author

    Vernon, N.

  • Volume
    23
  • Issue
    1
  • fYear
    1977
  • fDate
    1/1/1977 12:00:00 AM
  • Firstpage
    44
  • Lastpage
    48
  • Abstract
    As electronic circuits and systems have increased in complexity in recent years, so has the need to develop more sophisticated and easy-to-use automatic test equipment. The first generation of a.t.e, designed to stimulate circuit elements and examine outputs, has given way to guided-probe systems, which are resembling more and more closely the behaviour of skilled test technicians
  • fLanguage
    English
  • Journal_Title
    Electronics and Power
  • Publisher
    iet
  • ISSN
    0013-5127
  • Type

    jour

  • DOI
    10.1049/ep.1977.0025
  • Filename
    5184089