DocumentCode :
1265879
Title :
Measuring Quality Factor From a Nonlinear Frequency Response With Jump Discontinuities
Author :
Davis, Wyatt O.
Author_Institution :
MicroVision, Inc., Redmond, WA, USA
Volume :
20
Issue :
4
fYear :
2011
Firstpage :
968
Lastpage :
975
Abstract :
The convenient half-power bandwidth formula used for measurement of quality factor Q does not apply for nonlinear systems that have jump discontinuities in their frequency responses, since one of the half-power amplitudes is not observable. This paper shows alternatives to the half-power formula that do apply to such nonlinear systems, while preserving all of the convenience of the method. Their practical use is illustrated by experimental Q measurements for a microelectromechanical systems scanning mirror.
Keywords :
Q-factor measurement; frequency response; micromechanical devices; micromirrors; nonlinear systems; Q-factor measurement; half-power amplitudes; half-power bandwidth formula; jump discontinuities; microelectromechanical system scanning mirror; nonlinear frequency response; quality factor measurement; Damping; Equations; Frequency measurement; Micromechanical devices; Oscillators; Q measurement; Resonant frequency; Damping; Duffing´s equation; nonlinearity; quality factor;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2011.2159103
Filename :
5942132
Link To Document :
بازگشت