• DocumentCode
    1265879
  • Title

    Measuring Quality Factor From a Nonlinear Frequency Response With Jump Discontinuities

  • Author

    Davis, Wyatt O.

  • Author_Institution
    MicroVision, Inc., Redmond, WA, USA
  • Volume
    20
  • Issue
    4
  • fYear
    2011
  • Firstpage
    968
  • Lastpage
    975
  • Abstract
    The convenient half-power bandwidth formula used for measurement of quality factor Q does not apply for nonlinear systems that have jump discontinuities in their frequency responses, since one of the half-power amplitudes is not observable. This paper shows alternatives to the half-power formula that do apply to such nonlinear systems, while preserving all of the convenience of the method. Their practical use is illustrated by experimental Q measurements for a microelectromechanical systems scanning mirror.
  • Keywords
    Q-factor measurement; frequency response; micromechanical devices; micromirrors; nonlinear systems; Q-factor measurement; half-power amplitudes; half-power bandwidth formula; jump discontinuities; microelectromechanical system scanning mirror; nonlinear frequency response; quality factor measurement; Damping; Equations; Frequency measurement; Micromechanical devices; Oscillators; Q measurement; Resonant frequency; Damping; Duffing´s equation; nonlinearity; quality factor;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2011.2159103
  • Filename
    5942132