Title :
Fault simulation and test algorithm generation for random access memories
Author :
Wu, Chi-Feng ; Huang, Chih-Tsun ; Cheng, Kuo-Liang ; Wu, Cheng-Wen
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fDate :
4/1/2002 12:00:00 AM
Abstract :
The size and density of semiconductor memories is rapidly growing, making them increasingly harder to test. New fault models and test algorithms have been continuously proposed to cover defects and failures of modern memory chips and cores. However, software tool support for automating the memory test development procedure is still insufficient. For this purpose, we have developed a fault simulator (called RAMSES) and a test algorithm generator (called TAGS) for random-access memories (RAMs). In this paper, we present the algorithms and other details of RAMSES and TAGS and the experimental results of these tools on various memory architectures and configurations. We show that efficient test algorithms can be generated automatically for bit-oriented memories, word-oriented memories, and multiport memories, with 100% coverage of the given typical RAM faults
Keywords :
automatic test pattern generation; fault simulation; integrated circuit testing; random-access storage; RAMSES; TAGS; bit-oriented memory; fault simulation; multiport memory; random access memory; semiconductor memory; software tool; test algorithm generation; word-oriented memory; Algorithm design and analysis; Analytical models; Automatic testing; Circuit faults; Circuit testing; Random access memory; Read-write memory; Semiconductor device testing; Semiconductor memory; Technical Activities Guide -TAG;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
