Title :
A Three-Phase Synthetic Test-Circuit for Metal-Enclosed Circuit-Breakers
Author :
van der Sluis, L. ; van der Linden, W.A.
Author_Institution :
KEMA High-Power Laboratories, Arnhem, The Netherlands
fDate :
7/1/1987 12:00:00 AM
Keywords :
Circuit testing; Current transformers; Dielectrics; Electrodynamics; Laboratories; Samarium; Substations; Switches; Thermal stresses; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1987.5526981
