DocumentCode :
1266419
Title :
A Three-Phase Synthetic Test-Circuit for Metal-Enclosed Circuit-Breakers
Author :
van der Sluis, L. ; van der Linden, W.A.
Author_Institution :
KEMA High-Power Laboratories, Arnhem, The Netherlands
Issue :
7
fYear :
1987
fDate :
7/1/1987 12:00:00 AM
Firstpage :
54
Lastpage :
54
Keywords :
Circuit testing; Current transformers; Dielectrics; Electrodynamics; Laboratories; Samarium; Substations; Switches; Thermal stresses; Voltage;
fLanguage :
English
Journal_Title :
Power Engineering Review, IEEE
Publisher :
ieee
ISSN :
0272-1724
Type :
jour
DOI :
10.1109/MPER.1987.5526981
Filename :
5526981
Link To Document :
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