Title :
Reliability and Field Experience of Vacuum Interrupters
Author :
Okawa, M. ; Tsutsumi, T. ; Aiyoshi, T.
Author_Institution :
Toshiba Corporation, Tokyo, Japan
fDate :
7/1/1987 12:00:00 AM
Keywords :
Construction; Corrosion; Electric shock; Interrupters; Magnetic field measurement; Magnetic shielding; Monitoring; Pressure measurement; Testing; Vacuum systems;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1987.5526986
