DocumentCode :
1266966
Title :
Compact and Accurate Models of Large Single-Wall Carbon-Nanotube Interconnects
Author :
Ferranti, Francesco ; Antonini, Giulio ; Dhaene, Tom ; Knockaert, Luc ; Orlandi, Antonio
Author_Institution :
Dept. of Inf. Technol. (INTEC), Ghent Univ., Ghent, Belgium
Volume :
53
Issue :
4
fYear :
2011
Firstpage :
1025
Lastpage :
1033
Abstract :
Single-wall carbon nanotubes (SWCNTs) have been proposed for very large scale integration interconnect applications and their modeling is carried out using the multiconductor transmission line (MTL) formulation. Their time-domain analysis has some simulation issues related to the high number of SWCNTs within each bundle, which results in a highly complex model and loss of accuracy in the case of long interconnects. In recent years, several techniques have been proposed to reduce the complexity of the model whose accuracy decreases as the interconnection length increases. This paper presents a rigorous new technique to generate accurate reduced-order models of large SWCNT interconnects. The frequency response of the MTL is computed by using the spectral form of the dyadic Green´s function of the 1-D propagation problem and the model complexity is reduced using rational-model identification techniques. The proposed approach is validated by numerical results involving hundreds of SWCNTs, which confirm its capability of reducing the complexity of the model, while preserving accuracy over a wide frequency range.
Keywords :
Green´s function methods; VLSI; carbon nanotubes; frequency response; integrated circuit interconnections; multiconductor transmission lines; time-domain analysis; 1D propagation; C; dyadic Green´s function; frequency response; interconnection length; multiconductor transmission line; rational-model identification; single-wall carbon-nanotube; time-domain analysis; very large scale integration interconnect; Computational modeling; Frequency domain analysis; Impedance; Integrated circuit interconnections; Mathematical model; Resistance; Time domain analysis; Model order reduction; nano-interconnects; single-wall carbon nanotubes (SWCNTs); transient analysis; transmission line (TL) modeling;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2011.2159207
Filename :
5944965
Link To Document :
بازگشت