DocumentCode
1267311
Title
Hardware Implementation of Nakagami and Weibull Variate Generators
Author
Alimohammad, Amirhossein ; Fard, Saeed Fouladi ; Cockburn, Bruce F.
Author_Institution
Dept. of Electr. & Comput. Eng., San Diego State Univ., San Diego, CA, USA
Volume
20
Issue
7
fYear
2012
fDate
7/1/2012 12:00:00 AM
Firstpage
1276
Lastpage
1284
Abstract
An efficient implementation of Nakagami- m and Weibull variate generators on a single field-programmable gate array (FPGA) is presented. The hardware model first generates a correlated Rayleigh fading variate sequence and then transforms it into a sequence of Nakagami-m or Weibull fading variates. A biquad processor facilitates the compact implementation of a Rayleigh variate generator with arbitrary autocorrelation properties. A combination of logarithmic and linear domain segmentations along with piece-wise linear approximations is used to accurately implement the nonlinear numerical functions required to transform the correlated Rayleigh fading process into Nakagami-m or Weibull fading processes. When implemented on a Xilinx Virtex-5 5VSX240TFF1738-2 FPGA, the fading simulator uses only 1.6% of the configurable slices, 1.2% of the DSP48E modules and 3 block memories, while operating at 120 MHz, generating 120 million complex variates per second. The throughput can be increased up to 373 MHz with this FPGA if two separate clock sources are utilized.
Keywords
Nakagami channels; Rayleigh channels; field programmable gate arrays; Nakagami variate generators; Nakagami-m fading variates; Weibull fading variates; Weibull variate generators; biquad processor; correlated Rayleigh fading variate sequence; field programmable gate array; hardware model; linear domain segmentation; logarithmic domain segmentation; piecewise linear approximation; Approximation methods; Generators; Hardware; Nakagami distribution; Random access memory; Rayleigh channels; Field-programmable gate arrays (FPGAs); IIR filters; Nakagami fading channels; Rayleigh channels; Weibull fading channels; radio channel simulators;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2011.2156822
Filename
5945009
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