DocumentCode :
1267311
Title :
Hardware Implementation of Nakagami and Weibull Variate Generators
Author :
Alimohammad, Amirhossein ; Fard, Saeed Fouladi ; Cockburn, Bruce F.
Author_Institution :
Dept. of Electr. & Comput. Eng., San Diego State Univ., San Diego, CA, USA
Volume :
20
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
1276
Lastpage :
1284
Abstract :
An efficient implementation of Nakagami- m and Weibull variate generators on a single field-programmable gate array (FPGA) is presented. The hardware model first generates a correlated Rayleigh fading variate sequence and then transforms it into a sequence of Nakagami-m or Weibull fading variates. A biquad processor facilitates the compact implementation of a Rayleigh variate generator with arbitrary autocorrelation properties. A combination of logarithmic and linear domain segmentations along with piece-wise linear approximations is used to accurately implement the nonlinear numerical functions required to transform the correlated Rayleigh fading process into Nakagami-m or Weibull fading processes. When implemented on a Xilinx Virtex-5 5VSX240TFF1738-2 FPGA, the fading simulator uses only 1.6% of the configurable slices, 1.2% of the DSP48E modules and 3 block memories, while operating at 120 MHz, generating 120 million complex variates per second. The throughput can be increased up to 373 MHz with this FPGA if two separate clock sources are utilized.
Keywords :
Nakagami channels; Rayleigh channels; field programmable gate arrays; Nakagami variate generators; Nakagami-m fading variates; Weibull fading variates; Weibull variate generators; biquad processor; correlated Rayleigh fading variate sequence; field programmable gate array; hardware model; linear domain segmentation; logarithmic domain segmentation; piecewise linear approximation; Approximation methods; Generators; Hardware; Nakagami distribution; Random access memory; Rayleigh channels; Field-programmable gate arrays (FPGAs); IIR filters; Nakagami fading channels; Rayleigh channels; Weibull fading channels; radio channel simulators;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2011.2156822
Filename :
5945009
Link To Document :
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