DocumentCode :
1267327
Title :
Efficient computation of frequency-dependent parameters for on-chip interconnects via two-dimensional FDTD and time signal prediction technique
Author :
Yuan, Zhengyu ; Li, Zhengfan
Author_Institution :
Dept. of Electron. Eng., Shanghai Jiaotong Univ., China
Volume :
22
Issue :
4
fYear :
1999
fDate :
11/1/1999 12:00:00 AM
Firstpage :
665
Lastpage :
672
Abstract :
An efficient two-dimensional finite difference time domain (2-D-FDTD) method combined with time signal prediction technique has been proposed for the frequency-dependent parameters computation of on-chip interconnects in high-speed integrated circuits (ICs). A graded mesh algorithm and lossy absorbing boundary condition are proposed and adopted in the 2-D FDTD analysis to reduce the number of spatial grid points in the simulation region. The introduction of time signal prediction technique to predict the future signal in the time domain or extract the parameters in the frequency domain of uniform transmission lines reduces the computation time drastically. With these, the substrate and conductor losses are both included in one analysis. This algorithm leads to a significant reduction in CPU time and storage requirements as compared with the conventional FDTD. The simulation results are in good agreement with the results obtained by other methods and measurements
Keywords :
finite difference time-domain analysis; high-speed integrated circuits; integrated circuit design; integrated circuit interconnections; mesh generation; computation time; conductor losses; frequency-dependent parameters; graded mesh algorithm; high-speed integrated circuits; lossy absorbing boundary condition; on-chip interconnects; spatial grid points; storage requirements; time signal prediction technique; two-dimensional FDTD; uniform transmission lines; Algorithm design and analysis; Analytical models; Boundary conditions; Circuit simulation; Computational modeling; Finite difference methods; Frequency; High speed integrated circuits; Integrated circuit interconnections; Time domain analysis;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/6040.803459
Filename :
803459
Link To Document :
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