• DocumentCode
    1267615
  • Title

    Reduced ground bounce and improved latch-up suppression through substrate conduction

  • Author

    Gabara, Thaddeus

  • Author_Institution
    AT&T Bell Lab., Allentown, PA, USA
  • Volume
    23
  • Issue
    5
  • fYear
    1988
  • fDate
    10/1/1988 12:00:00 AM
  • Firstpage
    1224
  • Lastpage
    1232
  • Abstract
    The conventional method of bond wiring Vss pads on CMOS chips is examined. For p-type epitaxial CMOS on a p+ substrate, these Vss pads may not be required. Instead, the conduction path would be through the substrate to the ground plane on the package. This technique reduces the ground bounce and improves latch-up suppression. Furthermore, for input/output (I/O) bound chips, the substrate conduction method reduces the size of the I/O frame, reduces cost by decreasing die size, and improves performance by reducing conductor lengths on the chip. An ADVICE comparison was performed between the conventional and substrate conduction methods for connection VSS to a CMOS chip in 0.9-μm technology. Results of packaged-chip measurements are also presented
  • Keywords
    CMOS integrated circuits; VLSI; digital integrated circuits; integrated circuit technology; 0.9 micron; ADVICE comparison; CMOS chips; I/O frame size reduction; IC technology; PGA packages; VLSI; conductor lengths reduction; cost reduction; die size reduction; epitaxial CMOS; ground bounce reduction; latch-up suppression; packaged-chip measurements; substrate conduction; Bonding; Conductors; Costs; Electronics packaging; Inductance; Noise reduction; Substrates; Variable structure systems; Very large scale integration; Wires;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.5948
  • Filename
    5948