DocumentCode
1267615
Title
Reduced ground bounce and improved latch-up suppression through substrate conduction
Author
Gabara, Thaddeus
Author_Institution
AT&T Bell Lab., Allentown, PA, USA
Volume
23
Issue
5
fYear
1988
fDate
10/1/1988 12:00:00 AM
Firstpage
1224
Lastpage
1232
Abstract
The conventional method of bond wiring V ss pads on CMOS chips is examined. For p-type epitaxial CMOS on a p+ substrate, these V ss pads may not be required. Instead, the conduction path would be through the substrate to the ground plane on the package. This technique reduces the ground bounce and improves latch-up suppression. Furthermore, for input/output (I/O) bound chips, the substrate conduction method reduces the size of the I/O frame, reduces cost by decreasing die size, and improves performance by reducing conductor lengths on the chip. An ADVICE comparison was performed between the conventional and substrate conduction methods for connection V SS to a CMOS chip in 0.9-μm technology. Results of packaged-chip measurements are also presented
Keywords
CMOS integrated circuits; VLSI; digital integrated circuits; integrated circuit technology; 0.9 micron; ADVICE comparison; CMOS chips; I/O frame size reduction; IC technology; PGA packages; VLSI; conductor lengths reduction; cost reduction; die size reduction; epitaxial CMOS; ground bounce reduction; latch-up suppression; packaged-chip measurements; substrate conduction; Bonding; Conductors; Costs; Electronics packaging; Inductance; Noise reduction; Substrates; Variable structure systems; Very large scale integration; Wires;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.5948
Filename
5948
Link To Document