• DocumentCode
    1267978
  • Title

    Timing verification using statically sensitizable paths

  • Author

    Benkoski, Jacques ; Vanden Meersch, Erik ; Claesen, Luc J M ; De Man, Hugo

  • Author_Institution
    IMEC, Heverlee, Belgium
  • Volume
    9
  • Issue
    10
  • fYear
    1990
  • fDate
    10/1/1990 12:00:00 AM
  • Firstpage
    10723
  • Lastpage
    10784
  • Abstract
    A new approach to the false path problem in timing verifiers is presented. This approach is based on the modeling of both the logic and timing behavior of a circuit. Using the logic propagation conditions associated with each delay, efficient algorithms have been developed to find statically sensitizable paths. These algorithms simultaneously perform a longest path search and a partial verification of the sensitization of the paths. The resulting paths undergo a final and complete sensitization. The algorithms find the longest statically sensitizable path, whose length is a lower bound to the critical path length, and its associated sensitizing input vector. The algorithms can be easily modified to provide an ordered list of all the statically sensitizable paths above a given threshold. An initial analysis of the circuit by the PERT algorithm guides the critical path search and allows pruning of subgraphs that cannot lead to the solution. Results show that these techniques succeed in curbing the combinatorial explosion associated with the longest statically sensitizable path search
  • Keywords
    PERT; circuit analysis computing; critical path analysis; graph theory; logic CAD; PERT algorithm; critical path search; false path problem; logic behaviour modelling; logic propagation conditions; longest path search; partial verification; statically sensitizable paths; subgraphs; timing verifiers; Algorithm design and analysis; Circuit analysis; Circuit simulation; Explosions; Helium; Logic circuits; Propagation delay; Timing; Vectors; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.62737
  • Filename
    62737