Title :
A 128-Channel, 8.9-ps LSB, Column-Parallel Two-Stage TDC Based on Time Difference Amplification for Time-Resolved Imaging
Author :
Mandai, Shingo ; Charbon, Edoardo
Author_Institution :
Technol. Univ. of Delft, Delft, Netherlands
Abstract :
This paper proposes a 128-channel column-parallel two-stage time-to-digital converter (TDC) utilizing a time difference amplifier (TDA) and shows measurement results obtained from an implementation in a 0.35- μm CMOS process. The first stage operates as a coarse TDC, the time residue is amplified by a TDA, then converted by the second-stage TDC. As the gain of the time difference amplifier can be adjusted from 8.5 to 20.4, the time resolution of the TDC can be tuned from 21.4 to 8.9 ps. The time resolution variation due to process-voltage-temperature (PVT) effects is ± 5.8% without calibration when the time resolution is 12.9 ps. We propose a calibration method to compensate LSB changes due to the power supply fluctuation and temperature variation.
Keywords :
CMOS integrated circuits; amplifiers; calibration; nuclear electronics; positron emission tomography; power supplies to apparatus; time-digital conversion; CMOS process; TDC time resolution; calibration method; column-parallel two-stage time-to-digital converter; positron emission tomography; power supply Ωuctuation; process-voltage-temperature effects; size 0.35 mum; time 21.4 ps to 8.9 ps; time difference amplifier; time residue amplification; time-resolved imaging method; Delay; Jitter; Power supplies; Radiation detectors; Synchronization; Voltage-controlled oscillators; Fluorescence lifetime imaging microscopy (FLIM); positron emission tomography (PET); time-of-flight (TOF); time-to-digital converter (TDC);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2208761
