• DocumentCode
    1268293
  • Title

    Rethinking deep-submicron circuit design

  • Author

    Sylvester, Dennis ; Keutzer, Kurt

  • Author_Institution
    Synopsys Inc., USA
  • Volume
    32
  • Issue
    11
  • fYear
    1999
  • fDate
    11/1/1999 12:00:00 AM
  • Firstpage
    25
  • Lastpage
    33
  • Abstract
    Interconnect delay need not increase as CMOS process geometries shrink, and current IC design methods should suffice for modules of up to 50,000 gates. Beyond that, designers must focus on a new concept - global interconnect design. We consider the effects of both devices and interconnect, and our analysis shows that interconnect delay actually decreases for deep-submicron (DSM) processes in a modular design approach. The physical explanations of these DSM effects shed insight into this and other potential impacts on future high-performance ASIC designs
  • Keywords
    CMOS integrated circuits; application specific integrated circuits; integrated circuit design; integrated circuit interconnections; ASIC; CMOS IC; deep submicron circuit design; global interconnect design; modular design; CMOS process; Circuit synthesis; Crosstalk; Delay; Dielectrics; Energy consumption; Geometry; Integrated circuit interconnections; Virtual manufacturing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/2.803637
  • Filename
    803637