Title :
A 4.4 pJ/Access 80 MHz, 128 kbit Variability Resilient SRAM With Multi-Sized Sense Amplifier Redundancy
Author :
Sharma, Vishal ; Cosemans, S. ; Ashouei, M. ; Huisken, J. ; Catthoor, Francky ; Dehaene, Wim
Author_Institution :
ESAT-MICAS Lab., Katholieke Univ. Leuven, Leuven, Belgium
Abstract :
An ultra low energy, 128 kbit 6T SRAM in 90 nm LP CMOS with energy consumption of 4.4 pJ/access, operating at 80 MHz for the wireless sensor applications is developed. The variability resilient and low power techniques developed include innovation in the local architecture with the use of local read/write assist circuitry. The energy-efficient hierarchical bit-lines structure includes low swing global bit-lines and VDD/2 pre-charged short local bit-lines. The innovative Multi-Sized SA redundancy (MS-SA-R) calibration technique for the global read sense amplifiers of the SRAM not only adds to the variability resilience but also yields maximum energy reduction compared with existing calibration techniques.
Keywords :
CMOS analogue integrated circuits; SRAM chips; amplifiers; calibration; wireless sensor networks; LP CMOS process; MS-SA-R calibration technique; VDD-2 precharged short local bit-lines; energy consumption; energy-efficient hierarchical bit-line structure; frequency 80 MHz; global read sense amplifiers; multisized SA redundancy calibration technique; multisized sense amplifier redundancy; size 90 nm; variability resilient SRAM; wireless sensor applications; Computer architecture; Decoding; Energy consumption; Logic gates; Random access memory; Redundancy; Transistors; Charge recycling; Multi-Sized SA; SRAM; WRITE masking; gated read buffer; ultra low energy;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2011.2159056