DocumentCode :
1268424
Title :
Electromagnetic scattering by metallic holes and its applications in microwave circuit design
Author :
Zeid, Ali ; Baudrand, Henri
Author_Institution :
Dept. of Telecommun., Univ. of Allepo, Syria
Volume :
50
Issue :
4
fYear :
2002
fDate :
4/1/2002 12:00:00 AM
Firstpage :
1198
Lastpage :
1206
Abstract :
The problem of arbitrarily incident plane-wave scattering from rod structures of thick conducting plates arranged with two-dimensional (2D) periodicity has been examined. The square approximation as well as truncated-square approximation of circular cross sections is used in this study. The impedance of cascaded screens and the reflection coefficient is calculated using the multimodal variational method for both TE- and TM-polarized incident electric field. The 2D periodic structure of holes described in this paper can be used for the purpose of designing new guiding microwave structures. A transverse resonance method is applied to solve this problem. The convergence behavior of the technique has also been examined. The numerical results of the reflection coefficient, surface impedance, and dispersion curves are presented
Keywords :
dispersion (wave); electromagnetic wave scattering; variational techniques; waveguide theory; TE-polarized field; TM-polarized field; arbitrarily incident plane-wave scattering; cascaded screens; convergence behavior; dispersion curves; electromagnetic scattering; guiding microwave structures; metallic holes; microwave circuit design; multimodal variational method; reflection coefficient; rod structures; square approximation; surface impedance; thick conducting plates; transverse resonance method; truncated-square approximation; two-dimensional periodicity; Circuit synthesis; Dielectrics; Electromagnetic reflection; Electromagnetic scattering; Periodic structures; Scattering parameters; Slabs; Structural rods; Surface impedance; Two dimensional displays;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.993425
Filename :
993425
Link To Document :
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