DocumentCode :
1268486
Title :
Temperature-Aware Idle Time Distribution for Leakage Energy Optimization
Author :
Bao, Min ; Andrei, Alexandru ; Eles, Petru ; Peng, Zebo
Author_Institution :
Dept. of Comput. & Inf. Sci., Linkoping Univ., Linkoping, Sweden
Volume :
20
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
1187
Lastpage :
1200
Abstract :
Large-scale integration with deep sub-micron technologies has led to high power densities and high chip working temperatures. At the same time, leakage energy has become the dominant energy consumption source of circuits due to reduced threshold voltages. Given the close interdependence between temperature and leakage current, temperature has become a major issue to be considered for power-aware system level design techniques. In this paper, we address the issue of leakage energy optimization through temperature aware idle time distribution (ITD). We first propose an offline ITD technique to optimize leakage energy consumption, where only static idle time is distributed. To account for the dynamic slack, we then propose an online ITD technique where both static and dynamic idle time are considered. To improve the efficiency of our ITD techniques, we also propose an analytical temperature analysis approach which is accurate and, yet, sufficiently fast to be used inside the energy optimization loop.
Keywords :
energy consumption; large scale integration; leakage currents; optimisation; power aware computing; temperature distribution; ITD techniques; analytical temperature analysis approach; chip working temperatures; close interdependence; deep submicron technology; dynamic idle time; dynamic slack; energy consumption source; energy optimization loop; large-scale integration; leakage current; leakage energy consumption; leakage energy optimization; offline ITD technique; online ITD technique; power density; power-aware system level design techniques; static idle time; temperature-aware idle time distribution; threshold voltages; Analytical models; Energy consumption; Optimization; Switches; Temperature distribution; Thermal resistance; Voltage control; Idle time distribution (ITD); leakage energy optimization; system level design; temperature aware design;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2011.2157542
Filename :
5948409
Link To Document :
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