• DocumentCode
    1268486
  • Title

    Temperature-Aware Idle Time Distribution for Leakage Energy Optimization

  • Author

    Bao, Min ; Andrei, Alexandru ; Eles, Petru ; Peng, Zebo

  • Author_Institution
    Dept. of Comput. & Inf. Sci., Linkoping Univ., Linkoping, Sweden
  • Volume
    20
  • Issue
    7
  • fYear
    2012
  • fDate
    7/1/2012 12:00:00 AM
  • Firstpage
    1187
  • Lastpage
    1200
  • Abstract
    Large-scale integration with deep sub-micron technologies has led to high power densities and high chip working temperatures. At the same time, leakage energy has become the dominant energy consumption source of circuits due to reduced threshold voltages. Given the close interdependence between temperature and leakage current, temperature has become a major issue to be considered for power-aware system level design techniques. In this paper, we address the issue of leakage energy optimization through temperature aware idle time distribution (ITD). We first propose an offline ITD technique to optimize leakage energy consumption, where only static idle time is distributed. To account for the dynamic slack, we then propose an online ITD technique where both static and dynamic idle time are considered. To improve the efficiency of our ITD techniques, we also propose an analytical temperature analysis approach which is accurate and, yet, sufficiently fast to be used inside the energy optimization loop.
  • Keywords
    energy consumption; large scale integration; leakage currents; optimisation; power aware computing; temperature distribution; ITD techniques; analytical temperature analysis approach; chip working temperatures; close interdependence; deep submicron technology; dynamic idle time; dynamic slack; energy consumption source; energy optimization loop; large-scale integration; leakage current; leakage energy consumption; leakage energy optimization; offline ITD technique; online ITD technique; power density; power-aware system level design techniques; static idle time; temperature-aware idle time distribution; threshold voltages; Analytical models; Energy consumption; Optimization; Switches; Temperature distribution; Thermal resistance; Voltage control; Idle time distribution (ITD); leakage energy optimization; system level design; temperature aware design;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2011.2157542
  • Filename
    5948409