Title :
Sharing memory in banyan-based ATM switches
Author :
Basak, Debashis ; Choudhury, Abhijit K. ; Hahne, Ellen L.
Author_Institution :
Bell Labs., Murray Hill, NJ, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
We study a multistage ATM switch in which shared-memory switching elements are arranged in a banyan topology. By “shared-memory,” we mean that each switching element uses output queueing and shares its local cell buffer memory among all its output ports. We apply a buffer management technique called delayed pushout that was originally designed for multistage ATM switches with hierarchical topologies. Delayed pushout combines a pushout mechanism, for sharing memory efficiently among queues within the same switching element, and a backpressure mechanism, for sharing memory across switch stages. The backpressure component has a threshold to restrict the amount of sharing between stages. A synergy emerges when pushout, backpressure, and this threshold are all employed together. Using a computer simulation of the switch under bursty traffic, we study delayed pushout as well as several simpler pushout and backpressure schemes under a variety of traffic conditions. Of the five schemes we simulate, delayed pushout is the only one that performs well under all load conditions
Keywords :
asynchronous transfer mode; buffer storage; delays; multistage interconnection networks; network topology; queueing theory; storage management; telecommunication traffic; backpressure mechanism; banyan based ATM switches; banyan topology; buffer management technique; bursty traffic; computer simulation; delayed pushout; hierarchical topologies; load conditions; local cell buffer memory; multistage ATM switch; output ports; output queueing; queues; shared memory switching elements; threshold; traffic conditions; Asynchronous transfer mode; B-ISDN; Delay; Logic; Memory management; Multiprocessor interconnection networks; Switches; Telecommunication traffic; Topology; Traffic control;
Journal_Title :
Selected Areas in Communications, IEEE Journal on