Title :
Statistics of transverse mode turn-on dynamics in VCSELs
Author :
Dellunde, J. ; Torrent, M.C. ; Sancho, J.M. ; Shore, K.A.
Author_Institution :
Dept. d´´Estructura i Constituents de la Materia, Barcelona Univ., Spain
fDate :
7/1/1997 12:00:00 AM
Abstract :
The turn-on process of a multimode VCSEL is investigated from a statistical point of view. Special attention Is paid to quantities such as time jitter and bit error rate. The single-mode performance of VCSELs during current modulation is compared to that of edge-emitting lasers
Keywords :
dynamics; electro-optical modulation; jitter; laser cavity resonators; laser modes; laser theory; semiconductor device models; semiconductor lasers; statistical analysis; surface emitting lasers; VCSELs; bit error rate; current modulation; edge-emitting lasers; multimode VCSEL; single-mode performance; statistics; time jitter; transverse mode turn-on dynamics; vertical cavity surface emitting lasers; Computational modeling; Discrete event simulation; Jitter; Laser excitation; Laser modes; Laser transitions; Semiconductor lasers; Statistics; Surface emitting lasers; Vertical cavity surface emitting lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of
