DocumentCode :
1269104
Title :
Introducing optoelectronics through automated characterisation of devices and virtual measurement software
Author :
Dunne, John ; Farrell, Tom ; McDonald, David ; O´Dowd, Ronan
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. Coll. Dublin, Ireland
Volume :
42
Issue :
4
fYear :
1999
fDate :
11/1/1999 12:00:00 AM
Abstract :
It is widely accepted that experimental work is essential for the student engineer. However, in the area of optoelectronics, the scope of many experiments has been limited by the issues of safety for the student, and the cost and complexity of the instruments and devices required. A step has been taken towards overcoming these limitations with the development of an integrated software environment for the automated characterisation of semiconductor lasers. This paper will firstly describe the software which has been developed. This is followed by a description of a brief introductory study whereby a small number of students compared their experiences of an experimental demonstration with that of a lecture oriented approach. An attempt is made to quantify their reaction through a short test paper however the main purpose of the study was to illustrate the feasibility of the concepts described. The network capabilities of the software can be used as a basis for a set of undergraduate experiments. Many students would have remote access to a single measurement set-up over a computer network. Alternatively, virtual measurements may be used by allowing students access to a database of laser data previously collected. Both proposals address the issues of safety and cost and thus the software developed offers a much wider scope for the introduction of optoelectronic experimental work
Keywords :
automatic test software; computer aided instruction; educational courses; electronic engineering computing; electronic engineering education; optoelectronic devices; semiconductor lasers; teaching; automated device characterisation; integrated software environment; optoelectronics education; safety; semiconductor lasers; undergraduate experiments; virtual measurement software; Computer networks; Costs; Databases; Engineering students; Instruments; Proposals; Safety devices; Semiconductor lasers; Software safety; Testing;
fLanguage :
English
Journal_Title :
Education, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9359
Type :
jour
DOI :
10.1109/13.804559
Filename :
804559
Link To Document :
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