• DocumentCode
    1269366
  • Title

    Using functional fault simulation and the difference fault model to estimate implementation fault coverage

  • Author

    Silberman, Gabriel M. ; Spillinger, Ilan

  • Author_Institution
    Dept. of Electr. Eng., Technion Israel Inst. of Technol., Haifa, Israel
  • Volume
    9
  • Issue
    12
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    1335
  • Lastpage
    1343
  • Abstract
    An approach to estimate the fault coverage of the implementation of a VLSI design obtained by fault simulation at the function level is presented. The proposed methodology begins by defining a fault model for the functional level, the difference fault model (DFM), which reflects all of the faults in the implementation level. Functional fault detection is recorded by performing a functional simulation of the design, with faults injected as determined by the DFM. The last step is to use the correspondence between the functional faults (in the DFM) and those of the implementation level to yield an estimate of the implementation fault coverage. The results obtained show a very good correlation between the estimated fault coverage, based on fault simulation at the functional level, and the actual fault coverage obtained by fault simulation on a gate-level implementation
  • Keywords
    VLSI; circuit analysis computing; digital integrated circuits; VLSI design; difference fault model; digital circuits; function level; functional fault simulation; implementation fault coverage estimation; Circuit faults; Circuit simulation; Circuit testing; Design for manufacture; Digital circuits; Fault detection; Libraries; Logic design; Very large scale integration; Yield estimation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.62778
  • Filename
    62778